Back to Top

FT4310 Bypass Diode Tester | ดิจิตอลมัลติมิเตอร์สำหรับงานตรวจสอบ Solar cell | HIOKI

sku:FT4310

Availability: In stock

฿0.00

ข้อมูลสินค้า

ดิจิตอลมัลติมิเตอร์สำหรับงานตรวจสอบ Solar cell



  • ตรวจสอบ Solar Panel bypass diodes ในช่วงกลางวัน โดยไม่จำเป็นต้องหยุดการทำงาน

  • หน้าจอแสดงผลการวัดได้พร้อมกันทุกค่าการวัด

  • ส่งข้อมูลอัตโนมัติด้วยเทคโนโลยีไร้สายผ่าน Bluetooth

 

Traditionally, bypass diodes can only be inspected for good working condition at night or when power is not being generated by the solar panels in order to verify that any applied current is guided past the solar cells. With the FT4310 Bypass Diode Tester, you can detect for open faults even when the sun is out without covering the panels. Also test for short-circuit faults and cell string losses.




Download

BYPASS DIODE TESTER FT4310 catalog
Catalog: GENNECT CROSS SF4071, SF4072 catalog

Inspect solar panel bypass diodes for opens and shorts in broad daylight without covering panels

Traditionally, bypass diodes can only be inspected for good working condition at night or when power is not being generated by the solar panels in order to verify that any applied current is guided past the solar cells.
With the FT4310, you can detect for open faults even when the sun is out without covering the panels.
Testing can also be performed at night.

*Testing for short-circuit faults can only be performed during the day.

Test for bypass diode open faults and other malfunctions using the strings in junction boxes

Easily test using the strings in the junction boxes, eliminating the need to climb onto the roof and dramatically improving work efficiency.

*Disconnect the string being measured from the interconnect prior to measurement.

 

Save time - simultaneously measure all electrical parameters

Simply set the rotary knob to “BPD TEST” and press the “Measure”button to measure and display all parameters necessary for fault identification (open-circuit voltage, short-circuit current, and bypass route resistance).
Measurement takes 2 sec. or less per string!

RBPR: Bypass route resistance value
Voc: Open-circuit voltage value
Isc + α1: Measuring current value
Isc: Short-circuit current value
Judgment: Presence of a bypass diode open fault (when set to comparator, judgment based using RBPR value as well)

Instantly create reports by a free app (GENNECT Cross)

GENNECT Cross, a free app designed specifically for use with Hioki measuring instruments, lets you check and manage measurement results and create reports.
The software provides a range of functionality that helps manage data in the field, including photographing measurement sites, placing measurement results on photographs, and saving hand written memos.

Be alerted to faults with an audible warning and by the instrument’s backlight

Red backlight and audible warning alert the user to possible faults.

Ex) Open fault (Using BPD TEST mode)
RBPR:The instrument indicates the open state (“opn”)

High-precision voltmeter ideal for detecting short-circuit faults

When a bypass diode experiences a short-circuit fault, the output voltage decreases (by about 10 V) because the corresponding solar panels are not contributing to the array’s generated power.
By detecting this difference, it is possible to detect bypass diode short-circuit faults and cell string losses.

The FT4310 incorporates a high-precision DC voltmeter so that it can detect a voltage difference of 10 V in a 1000 V system.
When used in Voc mode, which is specifically designed to measure open-circuit voltage, the instrument displays the voltage difference in less than 1 sec. and tests for a short-circuit fault.

Convenient accessories

● Bundled case with neck strap
Leave both hands free so you can precisely position test probes without worrying about dropping the instrument.

● Integrated "hold" button right on test leads
A button right at your fingertip on the test leads lets you hold measured values easily, eliminating
the need to operate a control on the instrument itself.
They also incorporate a handy light.

[Reference] Issues caused by faulty bypass diodes

Normal reading:
When a solar panel is obscured by a partial shadow (or when it fails), the current bypasses the panel in order prevent any drop-off in generating efficiency.

Short-circuit fault:
When a short-circuit fault occurs, the generated current flows in a loop, making it impossible to capture the generated power, resulting in lowered efficiency.

Open fault:
When an open fault occurs, current is forced to flow to the defective cell when it’s covered by a
shadow, causing the panel to heat up and posing the risk of fire.

Name
Model
แบรนด์สินค้า
Short Description

There are no products matching the selection.